Shuyi Niu, Jiawei Jin, Xiutian Huang, Yonggeng Wang, Wenhao Xu, Youyong Kong. Locating Faulty Applications via Semantic and Topology Estimation. In Ying Ding 0001, Jie Tang 0001, Juan F. Sequeda, Lora Aroyo, Carlos Castillo 0001, Geert-Jan Houben, editors, Companion Proceedings of the ACM Web Conference 2023, WWW 2023, Austin, TX, USA, 30 April 2023 - 4 May 2023. pages 528-532, ACM, 2023. [doi]
@inproceedings{NiuJHWXK23,
title = {Locating Faulty Applications via Semantic and Topology Estimation},
author = {Shuyi Niu and Jiawei Jin and Xiutian Huang and Yonggeng Wang and Wenhao Xu and Youyong Kong},
year = {2023},
doi = {10.1145/3543873.3584660},
url = {https://doi.org/10.1145/3543873.3584660},
researchr = {https://researchr.org/publication/NiuJHWXK23},
cites = {0},
citedby = {0},
pages = {528-532},
booktitle = {Companion Proceedings of the ACM Web Conference 2023, WWW 2023, Austin, TX, USA, 30 April 2023 - 4 May 2023},
editor = {Ying Ding 0001 and Jie Tang 0001 and Juan F. Sequeda and Lora Aroyo and Carlos Castillo 0001 and Geert-Jan Houben},
publisher = {ACM},
isbn = {978-1-4503-9419-2},
}