Shuanlong Niu, Bin Li, Xinggang Wang, Hui Lin. Defect Image Sample Generation With GAN for Improving Defect Recognition. IEEE T. Automation Science and Engineering, 17(3):1611-1622, 2020. [doi]
@article{NiuLWL20,
title = {Defect Image Sample Generation With GAN for Improving Defect Recognition},
author = {Shuanlong Niu and Bin Li and Xinggang Wang and Hui Lin},
year = {2020},
doi = {10.1109/TASE.2020.2967415},
url = {https://doi.org/10.1109/TASE.2020.2967415},
researchr = {https://researchr.org/publication/NiuLWL20},
cites = {0},
citedby = {0},
journal = {IEEE T. Automation Science and Engineering},
volume = {17},
number = {3},
pages = {1611-1622},
}