Samyeul Noh. 2 Metric learning for nearest neighbor classification and its analysis. In Proceedings of the 21st International Conference on Pattern Recognition, ICPR 2012, Tsukuba, Japan, November 11-15, 2012. pages 991-995, IEEE, 2012. [doi]
@inproceedings{Noh12, title = {2 Metric learning for nearest neighbor classification and its analysis}, author = {Samyeul Noh}, year = {2012}, url = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=6460302}, researchr = {https://researchr.org/publication/Noh12}, cites = {0}, citedby = {0}, pages = {991-995}, booktitle = {Proceedings of the 21st International Conference on Pattern Recognition, ICPR 2012, Tsukuba, Japan, November 11-15, 2012}, publisher = {IEEE}, isbn = {978-1-4673-2216-4}, }