Jan M. van Noortwijk, Johannes A. M. van der Weide, Maarten-Jan Kallen, Mahesh D. Pandey. Gamma processes and peaks-over-threshold distributions for time-dependent reliability. Rel. Eng. & Sys. Safety, 92(12):1651-1658, 2007. [doi]
@article{NoortwijkWKP07,
title = {Gamma processes and peaks-over-threshold distributions for time-dependent reliability},
author = {Jan M. van Noortwijk and Johannes A. M. van der Weide and Maarten-Jan Kallen and Mahesh D. Pandey},
year = {2007},
doi = {10.1016/j.ress.2006.11.003},
url = {http://dx.doi.org/10.1016/j.ress.2006.11.003},
researchr = {https://researchr.org/publication/NoortwijkWKP07},
cites = {0},
citedby = {0},
journal = {Rel. Eng. & Sys. Safety},
volume = {92},
number = {12},
pages = {1651-1658},
}