Successive Refinement for Pattern Recognition

Joseph A. O'Sullivan, Naveen Singla, M. Brandon Westover. Successive Refinement for Pattern Recognition. In Gadiel Seroussi, Alfredo Viola, editors, 2006 IEEE Information Theory Workshop, ITW 2006, Punta del Este, Uruguay, March 13-17, 2006. pages 141-145, IEEE, 2006. [doi]

@inproceedings{OSullivanSW06,
  title = {Successive Refinement for Pattern Recognition},
  author = {Joseph A. O'Sullivan and Naveen Singla and M. Brandon Westover},
  year = {2006},
  doi = {10.1109/ITW.2006.1633798},
  url = {https://doi.org/10.1109/ITW.2006.1633798},
  researchr = {https://researchr.org/publication/OSullivanSW06},
  cites = {0},
  citedby = {0},
  pages = {141-145},
  booktitle = {2006 IEEE Information Theory Workshop, ITW 2006, Punta del Este, Uruguay, March 13-17, 2006},
  editor = {Gadiel Seroussi and Alfredo Viola},
  publisher = {IEEE},
  isbn = {1-4244-0036-8},
}