Techniques to Have a Common Understanding of Test Aspects among Test Team Members

Tomohiro Odan, Shizuka Ban, Hiroki Iseri, Kumiko Iseri, Akiharu Satoh. Techniques to Have a Common Understanding of Test Aspects among Test Team Members. In 13th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2020, Porto, Portugal, October 24-28, 2020. pages 232-236, IEEE, 2020. [doi]

Authors

Tomohiro Odan

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Shizuka Ban

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Hiroki Iseri

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Kumiko Iseri

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Akiharu Satoh

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