Thorsten Oeder, Alberto Castellazzi, Martin Pfost. Electrical and thermal failure modes of 600 V p-gate GaN HEMTs. Microelectronics Reliability, 76:321-326, 2017. [doi]
@article{OederCP17,
title = {Electrical and thermal failure modes of 600 V p-gate GaN HEMTs},
author = {Thorsten Oeder and Alberto Castellazzi and Martin Pfost},
year = {2017},
doi = {10.1016/j.microrel.2017.06.046},
url = {https://doi.org/10.1016/j.microrel.2017.06.046},
researchr = {https://researchr.org/publication/OederCP17},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {76},
pages = {321-326},
}