Jeff Offutt. Test Automation: From Slow & Weak to Fast, Flaky, & Blind to Smart & Effective. In IEEE Conference on Software Testing, Verification and Validation, ICST 2023, Dublin, Ireland, April 16-20, 2023. pages 11, IEEE, 2023. [doi]
@inproceedings{Offutt23,
title = {Test Automation: From Slow & Weak to Fast, Flaky, & Blind to Smart & Effective},
author = {Jeff Offutt},
year = {2023},
doi = {10.1109/ICST57152.2023.00009},
url = {https://doi.org/10.1109/ICST57152.2023.00009},
researchr = {https://researchr.org/publication/Offutt23},
cites = {0},
citedby = {0},
pages = {11},
booktitle = {IEEE Conference on Software Testing, Verification and Validation, ICST 2023, Dublin, Ireland, April 16-20, 2023},
publisher = {IEEE},
isbn = {978-1-6654-5666-1},
}