A. Jefferson Offutt, Stephen D. Lee. An Empirical Evaluation of Weak Mutation. IEEE Trans. Software Eng., 20(5):337-344, 1994. [doi]
@article{OffuttL94,
title = {An Empirical Evaluation of Weak Mutation},
author = {A. Jefferson Offutt and Stephen D. Lee},
year = {1994},
url = {http://www.computer.org/tse/ts1994/e0337abs.htm},
tags = {empirical},
researchr = {https://researchr.org/publication/OffuttL94},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Software Eng.},
volume = {20},
number = {5},
pages = {337-344},
}