Binary Sparse Representation Based on Arbitrary Quality Metrics and Its Applications

Takahiro Ogawa, Sho Takahashi, Naofumi Wada, Akira Tanaka, Miki Haseyama. Binary Sparse Representation Based on Arbitrary Quality Metrics and Its Applications. IEICE Transactions, 101-A(11):1776-1785, 2018. [doi]

@article{OgawaTWTH18,
  title = {Binary Sparse Representation Based on Arbitrary Quality Metrics and Its Applications},
  author = {Takahiro Ogawa and Sho Takahashi and Naofumi Wada and Akira Tanaka and Miki Haseyama},
  year = {2018},
  url = {http://search.ieice.org/bin/summary.php?id=e101-a_11_1776},
  researchr = {https://researchr.org/publication/OgawaTWTH18},
  cites = {0},
  citedby = {0},
  journal = {IEICE Transactions},
  volume = {101-A},
  number = {11},
  pages = {1776-1785},
}