Blind Deep S3D Image Quality Evaluation via Local to Global Feature Aggregation

Heeseok Oh, Sewoong Ahn, Jongyoo Kim, Sanghoon Lee 0001. Blind Deep S3D Image Quality Evaluation via Local to Global Feature Aggregation. IEEE Transactions on Image Processing, 26(10):4923-4936, 2017. [doi]

@article{OhAKL17,
  title = {Blind Deep S3D Image Quality Evaluation via Local to Global Feature Aggregation},
  author = {Heeseok Oh and Sewoong Ahn and Jongyoo Kim and Sanghoon Lee 0001},
  year = {2017},
  doi = {10.1109/TIP.2017.2725584},
  url = {https://doi.org/10.1109/TIP.2017.2725584},
  researchr = {https://researchr.org/publication/OhAKL17},
  cites = {0},
  citedby = {0},
  journal = {IEEE Transactions on Image Processing},
  volume = {26},
  number = {10},
  pages = {4923-4936},
}