Akio Ohta, Chong Liu, Takashi Arai, Daichi Takeuchi, Hai Zhang, Katsunori Makihara, Seiichi Miyazaki. Resistance-Switching Characteristics of Si-rich Oxide Evaluated by Using Ni Nanodots as Electrodes in Conductive AFM Measurements. IEICE Transactions, 98-C(5):406-410, 2015. [doi]
@article{OhtaLATZMM15,
title = {Resistance-Switching Characteristics of Si-rich Oxide Evaluated by Using Ni Nanodots as Electrodes in Conductive AFM Measurements},
author = {Akio Ohta and Chong Liu and Takashi Arai and Daichi Takeuchi and Hai Zhang and Katsunori Makihara and Seiichi Miyazaki},
year = {2015},
url = {http://search.ieice.org/bin/summary.php?id=e98-c_5_406},
researchr = {https://researchr.org/publication/OhtaLATZMM15},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {98-C},
number = {5},
pages = {406-410},
}