Samuel T. Ojetola, Matthew J. Reno, Jack D. Flicker, Daniel Bauer, David Stoltzfuz. Testing Machine Learned Fault Detection and Classification on a DC Microgrid. In 2022 IEEE Power & Energy Society Innovative Smart Grid Technologies Conference, ISGT 2022, New Orleans, LA, USA, April 24-28, 2022. pages 1-5, IEEE, 2022. [doi]
@inproceedings{OjetolaRFBS22,
title = {Testing Machine Learned Fault Detection and Classification on a DC Microgrid},
author = {Samuel T. Ojetola and Matthew J. Reno and Jack D. Flicker and Daniel Bauer and David Stoltzfuz},
year = {2022},
doi = {10.1109/ISGT50606.2022.9817517},
url = {https://doi.org/10.1109/ISGT50606.2022.9817517},
researchr = {https://researchr.org/publication/OjetolaRFBS22},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {2022 IEEE Power & Energy Society Innovative Smart Grid Technologies Conference, ISGT 2022, New Orleans, LA, USA, April 24-28, 2022},
publisher = {IEEE},
isbn = {978-1-6654-3775-2},
}