Yasuhiro Okada, Hisato Fujisaka, Takeshi Kamio, Chang-Jun Ahn, Kazuhisa Haeiwa. Ising spin-grass error correction for unreliable nanoelectronic logic circuits. In 19th European Conference on Circuit Theory and Design, ECCTD 2009, Antalya, Turkey, August 23-27, 2009. pages 886-889, IEEE, 2009. [doi]
@inproceedings{OkadaFKAH09,
title = {Ising spin-grass error correction for unreliable nanoelectronic logic circuits},
author = {Yasuhiro Okada and Hisato Fujisaka and Takeshi Kamio and Chang-Jun Ahn and Kazuhisa Haeiwa},
year = {2009},
doi = {10.1109/ECCTD.2009.5275123},
url = {https://doi.org/10.1109/ECCTD.2009.5275123},
researchr = {https://researchr.org/publication/OkadaFKAH09},
cites = {0},
citedby = {0},
pages = {886-889},
booktitle = {19th European Conference on Circuit Theory and Design, ECCTD 2009, Antalya, Turkey, August 23-27, 2009},
publisher = {IEEE},
isbn = {978-1-4244-3896-9},
}