Hiroyuki Okamura, Tadashi Dohi. A Generalized Bivariate Modeling Framework of Fault Detection and Correction Processes. In 28th IEEE International Symposium on Software Reliability Engineering, ISSRE 2017, Toulouse, France, October 23-26, 2017. pages 35-45, IEEE Computer Society, 2017. [doi]
@inproceedings{OkamuraD17-0,
title = {A Generalized Bivariate Modeling Framework of Fault Detection and Correction Processes},
author = {Hiroyuki Okamura and Tadashi Dohi},
year = {2017},
doi = {10.1109/ISSRE.2017.22},
url = {http://doi.ieeecomputersociety.org/10.1109/ISSRE.2017.22},
researchr = {https://researchr.org/publication/OkamuraD17-0},
cites = {0},
citedby = {0},
pages = {35-45},
booktitle = {28th IEEE International Symposium on Software Reliability Engineering, ISSRE 2017, Toulouse, France, October 23-26, 2017},
publisher = {IEEE Computer Society},
isbn = {978-1-5386-0941-5},
}