Hiroyuki Okamura, Yuki Takekoshi, Tadashi Dohi. Fine-Grained Software Reliability Estimation Using Software Testing Inputs. In 2015 IEEE International Conference on Software Quality, Reliability and Security, QRS 2015, Vancouver, BC, Canada, August 3-5, 2015. pages 85-92, IEEE, 2015. [doi]
@inproceedings{OkamuraTD15, title = {Fine-Grained Software Reliability Estimation Using Software Testing Inputs}, author = {Hiroyuki Okamura and Yuki Takekoshi and Tadashi Dohi}, year = {2015}, doi = {10.1109/QRS.2015.22}, url = {http://dx.doi.org/10.1109/QRS.2015.22}, researchr = {https://researchr.org/publication/OkamuraTD15}, cites = {0}, citedby = {0}, pages = {85-92}, booktitle = {2015 IEEE International Conference on Software Quality, Reliability and Security, QRS 2015, Vancouver, BC, Canada, August 3-5, 2015}, publisher = {IEEE}, isbn = {978-1-4673-7989-2}, }