Yukio Okuda, Nobuyuki Furukawa. Hysteresis of Intrinsic IDDQ Currents. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 555-564, IEEE Computer Society, 2003. [doi]
@inproceedings{OkudaF03, title = {Hysteresis of Intrinsic IDDQ Currents}, author = {Yukio Okuda and Nobuyuki Furukawa}, year = {2003}, url = {http://csdl.computer.org/comp/proceedings/itc/2003/2063/00/20630555abs.htm}, researchr = {https://researchr.org/publication/OkudaF03}, cites = {0}, citedby = {0}, pages = {555-564}, booktitle = {Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA}, publisher = {IEEE Computer Society}, isbn = {0-7803-8106-8}, }