Tape Cartridge Workload Characterization

Richard E. Olberding, Judy Koslov, William Lynch. Tape Cartridge Workload Characterization. In 23rd International Computer Measurement Group Conference, December 7-12, 1997, Orlando, Florida, USA, Proceedings. pages 231-236, Computer Measurement Group, 1997.

Authors

Richard E. Olberding

This author has not been identified. Look up 'Richard E. Olberding' in Google

Judy Koslov

This author has not been identified. Look up 'Judy Koslov' in Google

William Lynch

This author has not been identified. Look up 'William Lynch' in Google