Phil Oldiges, Kenneth P. Rodbell, Michael S. Gordon, John G. Massey, Kevin Stawiasz, Conal E. Murray, Henry H. K. Tang, K. Kim, K. Paul Muller. SOI FinFET soft error upset susceptibility and analysis. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 4, IEEE, 2015. [doi]
@inproceedings{OldigesRGMSMTKM15,
title = {SOI FinFET soft error upset susceptibility and analysis},
author = {Phil Oldiges and Kenneth P. Rodbell and Michael S. Gordon and John G. Massey and Kevin Stawiasz and Conal E. Murray and Henry H. K. Tang and K. Kim and K. Paul Muller},
year = {2015},
doi = {10.1109/IRPS.2015.7112729},
url = {http://dx.doi.org/10.1109/IRPS.2015.7112729},
researchr = {https://researchr.org/publication/OldigesRGMSMTKM15},
cites = {0},
citedby = {0},
pages = {4},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015},
publisher = {IEEE},
isbn = {978-1-4673-7362-3},
}