Semiconductor electronic parts testing efficiency

Martynov Oleg, Ogurtsov Alexander, Sashov Alexander. Semiconductor electronic parts testing efficiency. In East-West Design & Test Symposium, EWDTS 2013, Rostov-on-Don, Russia, September 27-30, 2013. pages 1-4, IEEE, 2013. [doi]

Authors

Martynov Oleg

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Ogurtsov Alexander

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Sashov Alexander

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