Shigeru Ono. Oxygen Atom Number Density Measurement in Microwave Excited Atmospheric Pressure O2-Ar Mixture Gas Plasma Using Electric Current Heated Catalytic Probe. In IIAI 4th International Congress on Advanced Applied Informatics, IIAI-AAI 2015, Okayama, Japan, July 12-16, 2015. pages 682-685, IEEE, 2015. [doi]
@inproceedings{Ono15-0,
title = {Oxygen Atom Number Density Measurement in Microwave Excited Atmospheric Pressure O2-Ar Mixture Gas Plasma Using Electric Current Heated Catalytic Probe},
author = {Shigeru Ono},
year = {2015},
doi = {10.1109/IIAI-AAI.2015.259},
url = {https://doi.org/10.1109/IIAI-AAI.2015.259},
researchr = {https://researchr.org/publication/Ono15-0},
cites = {0},
citedby = {0},
pages = {682-685},
booktitle = {IIAI 4th International Congress on Advanced Applied Informatics, IIAI-AAI 2015, Okayama, Japan, July 12-16, 2015},
publisher = {IEEE},
isbn = {978-1-4799-9958-3},
}