Elmet Orasson, Rein Raidma, Raimund Ubar, Gert Jervan, Zebo Peng. Fast Test Cost Calculation for Hybrid BIST in Digital Systems. In Euromicro Symposium on Digital Systems Design 2001 (Euro-DSD 2001), 4-6 September 2001, Warsaw, Poland. pages 318-325, IEEE Computer Society, 2001. [doi]
@inproceedings{OrassonRUJP01,
title = {Fast Test Cost Calculation for Hybrid BIST in Digital Systems},
author = {Elmet Orasson and Rein Raidma and Raimund Ubar and Gert Jervan and Zebo Peng},
year = {2001},
doi = {10.1109/DSD.2001.952315},
url = {http://doi.ieeecomputersociety.org/10.1109/DSD.2001.952315},
tags = {testing},
researchr = {https://researchr.org/publication/OrassonRUJP01},
cites = {0},
citedby = {0},
pages = {318-325},
booktitle = {Euromicro Symposium on Digital Systems Design 2001 (Euro-DSD 2001), 4-6 September 2001, Warsaw, Poland},
publisher = {IEEE Computer Society},
isbn = {0-7695-1239-9},
}