Dario Orive, Nagore Iriondo, Arantzazu Burgos, Isabel Sarachaga, Maria Luz Alvarez Gutierrez, Marga Marcos. Fault injection in Digital Twin as a means to test the response to process faults at virtual commissioning. In 24th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2019, Zaragoza, Spain, September 10-13, 2019. pages 1230-1234, IEEE, 2019. [doi]
@inproceedings{OriveIBSGM19, title = {Fault injection in Digital Twin as a means to test the response to process faults at virtual commissioning}, author = {Dario Orive and Nagore Iriondo and Arantzazu Burgos and Isabel Sarachaga and Maria Luz Alvarez Gutierrez and Marga Marcos}, year = {2019}, doi = {10.1109/ETFA.2019.8869334}, url = {https://doi.org/10.1109/ETFA.2019.8869334}, researchr = {https://researchr.org/publication/OriveIBSGM19}, cites = {0}, citedby = {0}, pages = {1230-1234}, booktitle = {24th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2019, Zaragoza, Spain, September 10-13, 2019}, publisher = {IEEE}, isbn = {978-1-7281-0303-7}, }