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Robust Discovery of Positive and Negative Rules in Knowledge Bases

Stefano Ortona, Venkata Vamsikrishna Meduri, Paolo Papotti. Robust Discovery of Positive and Negative Rules in Knowledge Bases. In 34th IEEE International Conference on Data Engineering, ICDE 2018, Paris, France, April 16-19, 2018. pages 1168-1179, IEEE Computer Society, 2018. [doi]

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Stefano Ortona

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Venkata Vamsikrishna Meduri

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Paolo Papotti

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