Fault Analysis and Test Generation for Programmable Logic Arrays (PLA s)

Daniel L. Ostapko, Se June Hong. Fault Analysis and Test Generation for Programmable Logic Arrays (PLA s). IEEE Transactions on Computers, 28(9):617-627, 1979.

@article{OstapkoH79,
  title = {Fault Analysis and Test Generation for Programmable Logic Arrays (PLA s)},
  author = {Daniel L. Ostapko and Se June Hong},
  year = {1979},
  tags = {program analysis, testing, analysis, logic programming, logic},
  researchr = {https://researchr.org/publication/OstapkoH79},
  cites = {0},
  citedby = {0},
  journal = {IEEE Transactions on Computers},
  volume = {28},
  number = {9},
  pages = {617-627},
}