Naoya Otaka, Yoshikazu Fukuyama, Yu Kawamura, Kenya Murakami, Adamo Santana, Tatsuya Iizaka, Tetsuro Matsui. Refrigerated Showcase Fault Detection by a Pasting based Artificial Neural Networks using Parallel Multi-population Modified Brain Storm optimization and Correntropy. In IEEE Congress on Evolutionary Computation, CEC 2020, Glasgow, United Kingdom, July 19-24, 2020. pages 1-8, IEEE, 2020. [doi]
@inproceedings{OtakaFKMSIM20, title = {Refrigerated Showcase Fault Detection by a Pasting based Artificial Neural Networks using Parallel Multi-population Modified Brain Storm optimization and Correntropy}, author = {Naoya Otaka and Yoshikazu Fukuyama and Yu Kawamura and Kenya Murakami and Adamo Santana and Tatsuya Iizaka and Tetsuro Matsui}, year = {2020}, doi = {10.1109/CEC48606.2020.9185511}, url = {https://doi.org/10.1109/CEC48606.2020.9185511}, researchr = {https://researchr.org/publication/OtakaFKMSIM20}, cites = {0}, citedby = {0}, pages = {1-8}, booktitle = {IEEE Congress on Evolutionary Computation, CEC 2020, Glasgow, United Kingdom, July 19-24, 2020}, publisher = {IEEE}, isbn = {978-1-7281-6929-3}, }