Secure scan chain using test port for tester authentication - researchr publication authors

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Yahia Ouahab, Donatus Silva Richard, Rashid Rashidzadeh. Secure scan chain using test port for tester authentication. In 2016 IEEE International Conference on Electronics, Circuits and Systems, ICECS 2016, Monte Carlo, Monaco, December 11-14, 2016. pages 412-415, IEEE, 2016. [doi]

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