J. P. Ousten, Zoubir Khatir. Investigations of thermal interfaces aging under thermal cycling conditions for power electronics applications. Microelectronics Reliability, 51(9-11):1830-1835, 2011. [doi]
@article{OustenK11,
title = {Investigations of thermal interfaces aging under thermal cycling conditions for power electronics applications},
author = {J. P. Ousten and Zoubir Khatir},
year = {2011},
doi = {10.1016/j.microrel.2011.07.066},
url = {http://dx.doi.org/10.1016/j.microrel.2011.07.066},
researchr = {https://researchr.org/publication/OustenK11},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {51},
number = {9-11},
pages = {1830-1835},
}