Test Selection Based on High Level Fault Simulation for Mixed-Signal Systems

Sule Ozev, Alex Orailoglu. Test Selection Based on High Level Fault Simulation for Mixed-Signal Systems. In 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada. pages 149-156, IEEE Computer Society, 2000. [doi]

Authors

Sule Ozev

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Alex Orailoglu

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