Cagatay Ozmen, Aydin Dirican, Nurettin Tan, Hieu Nguyen, Martin Margala. A CMOS ripple detector for integrated voltage regulator testing. In IEEE 58th International Midwest Symposium on Circuits and Systems, MWSCAS 2015, Fort Collins, CO, USA, August 2-5, 2015. pages 1-4, IEEE, 2015. [doi]
@inproceedings{OzmenDTNM15-0,
title = {A CMOS ripple detector for integrated voltage regulator testing},
author = {Cagatay Ozmen and Aydin Dirican and Nurettin Tan and Hieu Nguyen and Martin Margala},
year = {2015},
doi = {10.1109/MWSCAS.2015.7282194},
url = {https://doi.org/10.1109/MWSCAS.2015.7282194},
researchr = {https://researchr.org/publication/OzmenDTNM15-0},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {IEEE 58th International Midwest Symposium on Circuits and Systems, MWSCAS 2015, Fort Collins, CO, USA, August 2-5, 2015},
publisher = {IEEE},
isbn = {978-1-4673-6558-1},
}