Pei-Lin Pai. DRAM Industry Trend. In 14th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2006), 2-4 August 2006, Taipei, Taiwan. IEEE Computer Society, 2006. [doi]
@inproceedings{Pai06, title = {DRAM Industry Trend}, author = {Pei-Lin Pai}, year = {2006}, doi = {10.1109/MTDT.2006.11}, url = {http://doi.ieeecomputersociety.org/10.1109/MTDT.2006.11}, researchr = {https://researchr.org/publication/Pai06}, cites = {0}, citedby = {0}, booktitle = {14th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2006), 2-4 August 2006, Taipei, Taiwan}, publisher = {IEEE Computer Society}, isbn = {0-7695-2572-5}, }