Ganesh Pai, Joanne Bechta Dugan. Empirical Analysis of Software Fault Content and Fault Proneness Using Bayesian Methods. IEEE Trans. Software Eng., 33(10):675-686, 2007. [doi]
@article{PaiD07,
title = {Empirical Analysis of Software Fault Content and Fault Proneness Using Bayesian Methods},
author = {Ganesh Pai and Joanne Bechta Dugan},
year = {2007},
doi = {10.1109/TSE.2007.70722},
url = {http://doi.ieeecomputersociety.org/10.1109/TSE.2007.70722},
tags = {empirical, analysis},
researchr = {https://researchr.org/publication/PaiD07},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Software Eng.},
volume = {33},
number = {10},
pages = {675-686},
}