Bhaskar Pal, Arnab Sinha, Pallab Dasgupta, P. P. Chakrabarti, Kaushik De. Hardware accelerated constrained random test generation. IET Computers & Digital Techniques, 1(4):423-433, 2007. [doi]
@article{PalSDCD07,
title = {Hardware accelerated constrained random test generation},
author = {Bhaskar Pal and Arnab Sinha and Pallab Dasgupta and P. P. Chakrabarti and Kaushik De},
year = {2007},
doi = {10.1049/iet-cdt:20070016},
url = {http://dx.doi.org/10.1049/iet-cdt:20070016},
tags = {testing, random testing},
researchr = {https://researchr.org/publication/PalSDCD07},
cites = {0},
citedby = {0},
journal = {IET Computers & Digital Techniques},
volume = {1},
number = {4},
pages = {423-433},
}