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Outlier-Resistant Dissimilarity Measure for Feature-based Image Matching

Roman M. Palenichka, Ahmed Lakhssassi, Marek B. Zaremba. Outlier-Resistant Dissimilarity Measure for Feature-based Image Matching. In 20th International Conference on Pattern Recognition, ICPR 2010, Istanbul, Turkey, 23-26 August 2010. pages 846-849, IEEE, 2010. [doi]

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Roman M. Palenichka

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Ahmed Lakhssassi

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Marek B. Zaremba

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