Yangchen Palmo, Shigeaki Tanimoto, Hiroyuki Sato, Atsushi Kanai. Complementary Methods of IoT Reliability for Embedding IoT Devices into SDP. In 11th IEEE International Conference on Consumer Electronics, ICCE-Berlin 2021, Berlin, Germany, November 15-18, 2021. pages 1-6, IEEE, 2021. [doi]
@inproceedings{PalmoTSK21-0, title = {Complementary Methods of IoT Reliability for Embedding IoT Devices into SDP}, author = {Yangchen Palmo and Shigeaki Tanimoto and Hiroyuki Sato and Atsushi Kanai}, year = {2021}, doi = {10.1109/ICCE-Berlin53567.2021.9719996}, url = {https://doi.org/10.1109/ICCE-Berlin53567.2021.9719996}, researchr = {https://researchr.org/publication/PalmoTSK21-0}, cites = {0}, citedby = {0}, pages = {1-6}, booktitle = {11th IEEE International Conference on Consumer Electronics, ICCE-Berlin 2021, Berlin, Germany, November 15-18, 2021}, publisher = {IEEE}, isbn = {978-1-6654-2831-6}, }