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Yan Pan, Rao Desineni, Kannan Sekar, Atul Chittora, Sherwin Fernandes, Neerja Bawaskar, John M. Carulli. Pylon: Towards an integrated customizable volume diagnosis infrastructure. In 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016. pages 1-9, IEEE, 2016. [doi]

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