Guiying Pan, Fan Min, William Zhu. Test Cost Constraint Reduction with Common Cost. In Tai-Hoon Kim, Hojjat Adeli, Dominik Slezak, Frode Eika Sandnes, Xiaofeng Song, Kyo-Il Chung, Kirk P. Arnett, editors, Future Generation Information Technology - Third International Conference, FGIT 2011 in Conjunction with GDC 2011, Jeju Island, Korea, December 8-10, 2011. Proceedings. Volume 7105 of Lecture Notes in Computer Science, pages 55-63, Springer, 2011. [doi]
@inproceedings{PanMZ11, title = {Test Cost Constraint Reduction with Common Cost}, author = {Guiying Pan and Fan Min and William Zhu}, year = {2011}, doi = {10.1007/978-3-642-27142-7_8}, url = {http://dx.doi.org/10.1007/978-3-642-27142-7_8}, researchr = {https://researchr.org/publication/PanMZ11}, cites = {0}, citedby = {0}, pages = {55-63}, booktitle = {Future Generation Information Technology - Third International Conference, FGIT 2011 in Conjunction with GDC 2011, Jeju Island, Korea, December 8-10, 2011. Proceedings}, editor = {Tai-Hoon Kim and Hojjat Adeli and Dominik Slezak and Frode Eika Sandnes and Xiaofeng Song and Kyo-Il Chung and Kirk P. Arnett}, volume = {7105}, series = {Lecture Notes in Computer Science}, publisher = {Springer}, isbn = {978-3-642-27141-0}, }