Exposing image forgery with blind noise estimation

Xunyu Pan, Xing Zhang, Siwei Lyu. Exposing image forgery with blind noise estimation. In Chad Heitzenrater, Scott Craver, Jana Dittmann, editors, Proceedings of the thirteenth ACM multimedia workshop on Multimedia and security, MM&Sec '11, Buffalo, New York, USA, September 29-30, 2011. pages 15-20, ACM, 2011. [doi]

Authors

Xunyu Pan

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Xing Zhang

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Siwei Lyu

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