Attawat Panich, Wiwat Vatanawood. Detection of design patterns from class diagram and sequence diagrams using ontology. In 15th IEEE/ACIS International Conference on Computer and Information Science, ICIS 2016, Okayama, Japan, June 26-29, 2016. pages 1-6, IEEE, 2016. [doi]
@inproceedings{PanichV16,
title = {Detection of design patterns from class diagram and sequence diagrams using ontology},
author = {Attawat Panich and Wiwat Vatanawood},
year = {2016},
doi = {10.1109/ICIS.2016.7550771},
url = {http://doi.ieeecomputersociety.org/10.1109/ICIS.2016.7550771},
researchr = {https://researchr.org/publication/PanichV16},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {15th IEEE/ACIS International Conference on Computer and Information Science, ICIS 2016, Okayama, Japan, June 26-29, 2016},
publisher = {IEEE},
isbn = {978-1-5090-0806-3},
}