Mike Papadakis, Nicos Malevris. Automatic Mutation Test Case Generation via Dynamic Symbolic Execution. In IEEE 21st International Symposium on Software Reliability Engineering, ISSRE 2010, San Jose, CA, USA, 1-4 November 2010. pages 121-130, IEEE Computer Society, 2010. [doi]
@inproceedings{PapadakisM10, title = {Automatic Mutation Test Case Generation via Dynamic Symbolic Execution}, author = {Mike Papadakis and Nicos Malevris}, year = {2010}, doi = {10.1109/ISSRE.2010.38}, url = {http://dx.doi.org/10.1109/ISSRE.2010.38}, tags = {testing}, researchr = {https://researchr.org/publication/PapadakisM10}, cites = {0}, citedby = {0}, pages = {121-130}, booktitle = {IEEE 21st International Symposium on Software Reliability Engineering, ISSRE 2010, San Jose, CA, USA, 1-4 November 2010}, publisher = {IEEE Computer Society}, }