Fabio Pareschi, Gianluca Setti, Riccardo Rovatti. Statistical Testing of a Chaos Based CMOS True-Random Number Generator. Journal of Circuits, Systems, and Computers, 19(4):897-910, 2010. [doi]
@article{PareschiSR10,
title = {Statistical Testing of a Chaos Based CMOS True-Random Number Generator},
author = {Fabio Pareschi and Gianluca Setti and Riccardo Rovatti},
year = {2010},
doi = {10.1142/S0218126610006517},
url = {http://dx.doi.org/10.1142/S0218126610006517},
tags = {rule-based, testing, random testing},
researchr = {https://researchr.org/publication/PareschiSR10},
cites = {0},
citedby = {0},
journal = {Journal of Circuits, Systems, and Computers},
volume = {19},
number = {4},
pages = {897-910},
}