Thoroughness of Specification-Based Testing of Synchronous Programs

Ioannis Parissis, Jérôme Vassy. Thoroughness of Specification-Based Testing of Synchronous Programs. In 14th International Symposium on Software Reliability Engineering (ISSRE 2003), 17-20 November 2003, Denver, CO, USA. pages 191-202, IEEE Computer Society, 2003. [doi]

Authors

Ioannis Parissis

This author has not been identified. It may be one of the following persons: Look up 'Ioannis Parissis' in Google

Jérôme Vassy

This author has not been identified. Look up 'Jérôme Vassy' in Google