Jong In Park, Suk Joo Bae. Direct Prediction Methods on Lifetime Distribution of Organic Light-Emitting Diodes From Accelerated Degradation Tests. IEEE Transactions on Reliability, 59(1):74-90, 2010. [doi]
@article{ParkB10,
title = {Direct Prediction Methods on Lifetime Distribution of Organic Light-Emitting Diodes From Accelerated Degradation Tests},
author = {Jong In Park and Suk Joo Bae},
year = {2010},
doi = {10.1109/TR.2010.2040761},
url = {http://dx.doi.org/10.1109/TR.2010.2040761},
tags = {testing},
researchr = {https://researchr.org/publication/ParkB10},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Reliability},
volume = {59},
number = {1},
pages = {74-90},
}