BeomHee Park, Saurabh Biswas, Hangue Park. Electrical Characterization of the Tongue and the Soft Palate Using Lumped-Element Model for Intraoral Neuromodulation. IEEE Trans. Biomed. Engineering, 68(10):3151-3160, 2021. [doi]
@article{ParkBP21-0,
title = {Electrical Characterization of the Tongue and the Soft Palate Using Lumped-Element Model for Intraoral Neuromodulation},
author = {BeomHee Park and Saurabh Biswas and Hangue Park},
year = {2021},
doi = {10.1109/TBME.2021.3070867},
url = {https://doi.org/10.1109/TBME.2021.3070867},
researchr = {https://researchr.org/publication/ParkBP21-0},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Biomed. Engineering},
volume = {68},
number = {10},
pages = {3151-3160},
}