Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Seyoung Park, Jaeyeon Jang, Chang Ouk Kim. Discriminative feature learning and cluster-based defect label reconstruction for reducing uncertainty in wafer bin map labels. J. Intelligent Manufacturing, 32(1):251-263, 2021. [doi]