Jaewoo Park, Yoon Gyo Jung, Andrew Beng Jin Teoh. Revisiting ImprovedGAN with Metric Learning for Semi-Supervised Learning. In 25th International Conference on Pattern Recognition, ICPR 2020, Virtual Event / Milan, Italy, January 10-15, 2021. pages 1467-1474, IEEE, 2020. [doi]
@inproceedings{ParkJT20,
title = {Revisiting ImprovedGAN with Metric Learning for Semi-Supervised Learning},
author = {Jaewoo Park and Yoon Gyo Jung and Andrew Beng Jin Teoh},
year = {2020},
doi = {10.1109/ICPR48806.2021.9413222},
url = {https://doi.org/10.1109/ICPR48806.2021.9413222},
researchr = {https://researchr.org/publication/ParkJT20},
cites = {0},
citedby = {0},
pages = {1467-1474},
booktitle = {25th International Conference on Pattern Recognition, ICPR 2020, Virtual Event / Milan, Italy, January 10-15, 2021},
publisher = {IEEE},
isbn = {978-1-7281-8808-9},
}