Haram Park, Carlos Nkuba Kayembe, Seunghoon Woo, Heejo Lee. L2Fuzz: Discovering Bluetooth L2CAP Vulnerabilities Using Stateful Fuzz Testing. In 52nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2022, Baltimore, MD, USA, June 27-30, 2022. pages 343-354, IEEE, 2022. [doi]
@inproceedings{ParkKWL22,
title = {L2Fuzz: Discovering Bluetooth L2CAP Vulnerabilities Using Stateful Fuzz Testing},
author = {Haram Park and Carlos Nkuba Kayembe and Seunghoon Woo and Heejo Lee},
year = {2022},
doi = {10.1109/DSN53405.2022.00043},
url = {https://doi.org/10.1109/DSN53405.2022.00043},
researchr = {https://researchr.org/publication/ParkKWL22},
cites = {0},
citedby = {0},
pages = {343-354},
booktitle = {52nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2022, Baltimore, MD, USA, June 27-30, 2022},
publisher = {IEEE},
isbn = {978-1-6654-1693-1},
}