Eun Sei Park, M. Ray Mercer, Thomas W. Williams. The Total Delay Fault Model and Statistical Delay Fault Coverage. IEEE Transactions on Computers, 41(6):688-698, 1992.
@article{ParkMW92,
title = {The Total Delay Fault Model and Statistical Delay Fault Coverage},
author = {Eun Sei Park and M. Ray Mercer and Thomas W. Williams},
year = {1992},
tags = {coverage},
researchr = {https://researchr.org/publication/ParkMW92},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Computers},
volume = {41},
number = {6},
pages = {688-698},
}