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A study on the quality-embedded efficiency measurement in DEA

Jaehun Park, Si-Il Sung, Yong Jeong Kim, ByungKwon Lee, Hyerim Bae. A study on the quality-embedded efficiency measurement in DEA. INFOR, 56(2):247-263, 2018. [doi]

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Jaehun Park

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Si-Il Sung

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Yong Jeong Kim

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ByungKwon Lee

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Hyerim Bae

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