Jungmin Park, Akhilesh Tyagi. Using Power Clues to Hack IoT Devices: The power side channel provides for instruction-level disassembly. IEEE Consumer Electronics Magazine, 6(3):92-102, 2017. [doi]
@article{ParkT17-0,
title = {Using Power Clues to Hack IoT Devices: The power side channel provides for instruction-level disassembly},
author = {Jungmin Park and Akhilesh Tyagi},
year = {2017},
doi = {10.1109/MCE.2017.2684982},
url = {https://doi.org/10.1109/MCE.2017.2684982},
researchr = {https://researchr.org/publication/ParkT17-0},
cites = {0},
citedby = {0},
journal = {IEEE Consumer Electronics Magazine},
volume = {6},
number = {3},
pages = {92-102},
}